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Learner Reviews & Feedback for Optical and X-Ray Characterization by Arizona State University
13 ratings
About the Course
Optical and X-ray techniques are powerful ways to characterize semiconductor thin films. They can be used to measure film thickness, purity and crystalline quality, and for compositional analysis. Modern techniques are fast, turn-key, and generally non-destructive, allowing for rapid assessment of material properties. This course describes the fundamentals of optical and X-ray characterization and provides real-world examples of how they are used in semiconductor manufacturing.
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1 - 4 of 4 Reviews for Optical and X-Ray Characterization
By Kuna L N
•May 9, 2024
Quick introduction and review of important topics. I wish if more such courses are introduced.
By Carter H
•May 14, 2024
Very practical and useful, thanks!
By ZAHID U
•Dec 18, 2023
best course
By Ian B
•Jun 9, 2024
I do semiconductor and materials characterization for a living. so this course was too basic in my opinion, its an ok introduction to some of the instruments. Would be nice if there was more exercises like the one used for the solar cell roughness project.